Measurement System for Scanning Microscope Using Pulse Laser Light Source

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Fast Remaining Thickness Measurement Using a Laser Source Scanning Technique

Fast remaining thickness measurement using Lamb wave is presented for the purpose of maintenance of large structures like oil storage tanks and pipe networks. This study used a laser ultrasonic source to perform a high resolution remote scanning over aluminum plates with grooved and circular defects that were modeled on corrosions in plate-like structures. The antisymmetric A0 and symmetric S0 ...

متن کامل

Studying of various nanolithography methods by using Scanning Probe Microscope

The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...

متن کامل

Studying of various nanolithography methods by using Scanning Probe Microscope

The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...

متن کامل

Using Light Polarization in Laser Scanning

We use polarization analysis in triangulation-based laser scanners to disambiguate the true laser stripe from spurious inter-reflections caused by holes and concavities on metal surfaces. Stripe candidates are discriminated by projecting linearly polarised laser light and measuring the polarization state of the linearly polarized component of the observed stripe candidates. Initial experimental...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: IEEJ Transactions on Electronics, Information and Systems

سال: 2007

ISSN: 0385-4221,1348-8155

DOI: 10.1541/ieejeiss.127.1344